符合國家圖書館期刊報紙典藏數位化計畫的藏品

加工場肉品廢棄物厭氣處理

描述：來源期刊:畜產研究、卷期:33:3 民89.09、頁次:頁273-280
主題與關鍵字：肉品加工廢棄物　豬皮　豬毛　脂肪　碎肉　肺臟　厭氣處理　...
資料識別：A00021937

1015096/1161946

褐色菜鴨籠飼面積與族群大小對生產性能之影響

褐色菜鴨籠飼面積與族群大小對生產性能之影響

描述：來源期刊:畜產研究、卷期:33:3 民89.09、頁次:頁281-291
主題與關鍵字：籠底面積　族群大小　產蛋性能　褐色菜鴨　Cage floor area...
資料識別：A00021938

1015097/1161946

哺乳期荷蘭仔牛補充水分效益之評估

哺乳期荷蘭仔牛補充水分效益之評估

描述：來源期刊:畜產研究、卷期:33:3 民89.09、頁次:頁292-302
主題與關鍵字：仔牛　飲水　生長　Calf　Water intake　Growth
資料識別：A00021939

1015098/1161946

China in the Evolution of American Foreign Policy

China in the Evolution of American Foreign Policy

描述：來源期刊:Sino-American Relations、卷期:26:3 民89.秋、頁...
資料識別：A00021940

1015099/1161946

Challenges Confronting Taiwan's Engineering Education in the Twenty-first Century

Challenges Confronting Taiwan's Engineering Educatio...

描述：來源期刊:Sino-American Relations、卷期:26:3 民89.秋、頁...
資料識別：A00021941

1015100/1161946

From Allied War to Cold War: The Reaction of American Labor Unions to the Chinese Civil War， 1941-51

From Allied War to Cold War: The Reaction of America...

描述：來源期刊:Sino-American Relations、卷期:26:3 民89.秋、頁...
資料識別：A00021942

1015101/1161946

The Politics of Frank Norris's Chinese Characters

The Politics of Frank Norris's Chinese Characters

描述：來源期刊:Sino-American Relations、卷期:26:3 民89.秋、頁...
資料識別：A00021943

1015102/1161946

Testable Path Delay Fault Cover for Sequential Circuits

Testable Path Delay Fault Cover for Sequential Circu...

描述：來源期刊:Journal of Information Science and Engineering...
主題與關鍵字：Delay testing　Path delay faults　Timing defects　Sequen...
資料識別：A00021944

1015103/1161946

Flip-Flop Selection for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits

Flip-Flop Selection for Mixed Scan and Reset Design ...

描述：來源期刊:Journal of Information Science and Engineering...
主題與關鍵字：Partial scan　Partial reset　Reachable states　Test gene...
資料識別：A00021945

1015104/1161946

Compact Test Generation Using a Frozen Clock Testing Strategy

Compact Test Generation Using a Frozen Clock Testing...

描述：來源期刊:Journal of Information Science and Engineering...
主題與關鍵字：Automatic test generation　Compact test sets　Frozen clo...
資料識別：A00021946

1015105/1161946

Testability Improvement by Branch Point Control for Conditional Statements With Multiple Branches

Testability Improvement by Branch Point Control for ...

描述：來源期刊:Journal of Information Science and Engineering...
主題與關鍵字：VLSI　High-level test synthesis　Behavioral statement　B...
資料識別：A00021947

1015106/1161946

Testing Configurable LUT-Based FPGAs

Testing Configurable LUT-Based FPGAs

描述：來源期刊:Journal of Information Science and Engineering...
主題與關鍵字：FPGA　Fault detection　Bijection　Built-in self-test　BI...
資料識別：A00021948

1015107/1161946

A Behavior-Level Fault Model for the Closed-Loop Operational Amplifier

A Behavior-Level Fault Model for the Closed-Loop Ope...

描述：來源期刊:Journal of Information Science and Engineering...
主題與關鍵字：Fault simulation　Fault model　Macro-modeling　Operation...
資料識別：A00021949

1015108/1161946

Impulse Response Fault Model and Fault Extraction for Functional Level Analog Circuit Diagnosis

Impulse Response Fault Model and Fault Extraction fo...

描述：來源期刊:Journal of Information Science and Engineering...
主題與關鍵字：VLSI test　Analog test　Fault model　Diagnosis　Function...
資料識別：A00021950

1015109/1161946

A Probabilistic Model for Path Delay Fault Testing

A Probabilistic Model for Path Delay Fault Testing

描述：來源期刊:Journal of Information Science and Engineering...
主題與關鍵字：Digital testing　Path delay fault　Robust test　Synthesi...
資料識別：A00021951

1015110/1161946