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符合的藏品
共找到 1100 筆符合的資料
電導度法檢定落花生種子活力之研...
Electrical conductivity test 國家圖書館 20000600 期刊論文 侯金日(Hou， Chin-jin) 劉景平(Liu， Ching-ping) 郭華仁(Kuo， Warre.....more
- 766/1100
電子構裝覆晶接合導電膠接合製程...
無電鍍鎳 覆晶接合 導電膠 熱疲勞 網版印刷 Electroless nickel Flip chip Anisotropic electrical conductive adhesive.....more
- 767/1100
Preparation and Electrical Pro...
coefficient Figure of merit 國家圖書館 20000700 期刊論文 王志明(Wang， Chih-ming) Preparation and Electrical Properties.....more
- 768/1100
Modeling of the Fatigue Proces...
Electromyography Functional electrical stimulation Muscle fatigue Paraplegia 肌電訊號 功能性電刺激 肌肉疲勞 下肢癱瘓.....more
- 769/1100
Electromagnetic Scanning of Be...
整體電導度 牛屠體 後四分屠體 瘦肉預估 Total body electrical conductivity Beef carcass Hindquarter Lean estimation 國家.....more
- 770/1100
Material Selections and Three-...
-reluctance Machine 臺灣期刊論文索引系統 來源期刊:Journal of the Chinese Institute of Electrical Engineering 卷期:8:3.....more
- 771/1100
Improved Optimal Aim Strategy ...
:Journal of the Chinese Institute of Electrical Engineering 卷期:8:3 民90.08 頁次:頁241-255 A01024683 .....more
- 772/1100
An On-line Fault Estimation in...
of the Chinese Institute of Electrical Engineering 卷期:8:3 民90.08 頁次:頁267-277 A01024685 .....more
- 773/1100
Heuristic Load Balancing Schem...
:Journal of the Chinese Institute of Electrical Engineering 卷期:8:3 民90.08 頁次:頁279-289 A01024686 .....more
- 774/1100
Core-Based System-on-Chip Test...
引系統 來源期刊:Journal of the Chinese Institute of Electrical Engineering 卷期:8:4 民90.11 頁次:頁335-353.....more
- 775/1100
A BIST Architecture for AT-Spe...
of the Chinese Institute of Electrical Engineering 卷期:8:4 民90.11 頁次:頁387-394 A01035152 .....more
- 776/1100
Design and Verification for a ...
:Journal of the Chinese Institute of Electrical Engineering 卷期:8:4 民90.11 頁次:頁309-323 A01035146 .....more
- 777/1100
A Core-Centric Design Methodol...
論文索引系統 來源期刊:Journal of the Chinese Institute of Electrical Engineering 卷期:8:4 民90.11 頁次:頁299-307.....more
- 778/1100
Configuration Free SOC Interco...
BIST Methodology 臺灣期刊論文索引系統 來源期刊:Journal of the Chinese Institute of Electrical Engineering 卷期:8:4 民90.....more
- 779/1100
A Hierarchical Test Control Ar...
引系統 來源期刊:Journal of the Chinese Institute of Electrical Engineering 卷期:8:4 民90.11 頁次:頁355-363.....more
- 780/1100